April 13
Third meeting
Science and Technology I, Room 306, 11am (+ lunch after noon)
QOB informal talk
Prof. Chenggang Tao, Virginia Tech
Visualizing fluctuations and electron scattering in nanostructures
Nanoscale structures have high surface-to-volume ratio and are susceptible to structural fluctuations. Direct imaging at the atomic scale using scanned probe techniques allows us to quantitatively characterize fluctuations using the tools of statistical mechanics. The impact of structural fluctuations on electronic devices will be illustrated for the case of electromigration, the biased displacement of mass by electron scattering when electrical current flows through a device. Using a combination of scanning tunneling microscopy and scanning electron microscopy, we directly observed electromigration of silver and silver-C60 nanostructures. I will show how the scattering force is determined. Possible mechanisms for the large force, including current crowding, charge transfer and local heating, will be discussed.